Sequential learning for adaptive critic design: An industrial control application

Research output: Contribution to conference › Paper

Original language	English
Pages	265-270
Number of pages	6
Publication status	Published - Sept 2005
Event	IEEE Workshop on Machine Learning for Signal Processing (MLSP) - Mystic, Ct, United States Duration: 01 Sept 2005 → 01 Sept 2005

Conference	IEEE Workshop on Machine Learning for Signal Processing (MLSP)
Country/Territory	United States
City	Mystic, Ct
Period	01/09/2005 → 01/09/2005

Cite this

@conference{aad51e1c70354e78a68e5a8d680385dc,

title = "Sequential learning for adaptive critic design: An industrial control application",

author = "J.J. Govindhasamy and Se{\'a}n McLoone and George Irwin",

year = "2005",

month = sep,

language = "English",

pages = "265--270",

note = "IEEE Workshop on Machine Learning for Signal Processing (MLSP) ; Conference date: 01-09-2005 Through 01-09-2005",

}

TY - CONF

T1 - Sequential learning for adaptive critic design: An industrial control application

AU - Govindhasamy, J.J.

AU - McLoone, Seán

AU - Irwin, George

PY - 2005/9

Y1 - 2005/9

UR - https://www.scopus.com/pages/publications/33749078329

M3 - Paper

SP - 265

EP - 270

T2 - IEEE Workshop on Machine Learning for Signal Processing (MLSP)

Y2 - 1 September 2005 through 1 September 2005

ER -