Settling the ‘‘Dead Layer’’ Debate in Nanoscale Capacitors

Li-Wu Chang, M. Alexe, J.F. Scott, Marty Gregg

Research output: Contribution to journalArticlepeer-review

77 Citations (Scopus)

Abstract

Permittivity peaks in single crystal thin film capacitors are strongly suppressed compared to bulk in the case of Pt/SrTiO(3)/Pt, but are relatively unaffected in Pt/BaTiO(3)/Pt structures. This is consistent with the recent suggestion that subtle variations in interfacial bonding between the dielectric and electrode are critical in determining the presence or absence of inherent dielectric "dead layers".
Original languageEnglish
Pages (from-to)4911-4914
Number of pages4
JournalAdvanced Materials
Volume21
Issue number48
Early online date15 Aug 2009
DOIs
Publication statusPublished - 28 Dec 2009

ASJC Scopus subject areas

  • Mechanical Engineering
  • Mechanics of Materials
  • Materials Science(all)

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