Settling the ‘‘Dead Layer’’ Debate in Nanoscale Capacitors

Li-Wu Chang; M. Alexe; J.F. Scott; Marty Gregg

doi:10.1002/adma.200901756

Settling the ‘‘Dead Layer’’ Debate in Nanoscale Capacitors

Li-Wu Chang, M. Alexe, J.F. Scott, Marty Gregg

Research output: Contribution to journal › Article › peer-review

92 Citations (Scopus)

Abstract

Permittivity peaks in single crystal thin film capacitors are strongly suppressed compared to bulk in the case of Pt/SrTiO(3)/Pt, but are relatively unaffected in Pt/BaTiO(3)/Pt structures. This is consistent with the recent suggestion that subtle variations in interfacial bonding between the dielectric and electrode are critical in determining the presence or absence of inherent dielectric "dead layers".

Original language	English
Pages (from-to)	4911-4914
Number of pages	4
Journal	Advanced Materials
Volume	21
Issue number	48
Early online date	15 Aug 2009
DOIs	https://doi.org/10.1002/adma.200901756
Publication status	Published - 28 Dec 2009

ASJC Scopus subject areas

Mechanical Engineering
Mechanics of Materials
General Materials Science

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10.1002/adma.200901756

Cite this

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AB - Permittivity peaks in single crystal thin film capacitors are strongly suppressed compared to bulk in the case of Pt/SrTiO(3)/Pt, but are relatively unaffected in Pt/BaTiO(3)/Pt structures. This is consistent with the recent suggestion that subtle variations in interfacial bonding between the dielectric and electrode are critical in determining the presence or absence of inherent dielectric "dead layers".

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Settling the ‘‘Dead Layer’’ Debate in Nanoscale Capacitors

Abstract

ASJC Scopus subject areas

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