Single-shot characterisation of independent femtosecond extreme ultraviolet free electron andf infrared laser pulses

P. Radcliffe, S. Dusterer, A. Azima, H. Redin, H. Redin, J. Dardis, K. Kavanagh, H. Luna, J. Pedregoza Gutierrez, P. Yeates, E.T. Kennedy, J.T. Costello, A. Delserieys, Ciaran Lewis, R. Taieb, A. Maquet, D. Cubaynes, M. Meyer

Research output: Contribution to journalArticlepeer-review

63 Citations (Scopus)

Abstract

Two-color above threshold ionization of helium and xenon has been used to analyze the synchronization between individual pulses of the femtosecond extreme ultraviolet (XUV) free electron laser in Hamburg and an independent intense 120 fs mode-locked Ti:sapphire laser. Characteristic sidebands appear in the photoelectron spectra when the two pulses overlap spatially and temporally. The cross-correlation curve points to a 250 fs rms jitter between the two sources at the experiment. A more precise determination of the temporal fluctuation between the XUV and infrared pulses is obtained through the analysis of the single-shot sideband intensities. ©2007 American Institute of Physics
Original languageEnglish
Article number131108
Pages (from-to)131108-1-131108-3
Number of pages3
JournalApplied Physics Letters
Volume90
Issue number13
DOIs
Publication statusPublished - Mar 2007

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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