Soft x-ray free electron laser microfocus for exploring matter under extreme conditions

A.J. Nelson; S. Toleikis; H. Chapman; S. Bajt; J. Krzywinski; J. Chalupsky; L. Juha; J. Cihelka; V. Hajkova; L. Vysin; T. Burian; M. Kozlova; R.R. Faustlin; B. Nagler; S.M. Vinko; T. Whitcher; T. Dzelzainis; O. Renner; K. Saksl; A.R. Khorsand; P.A. Heimann; R. Sobierajski; D. Klinger; M. Jurek; J. Pelka; B. Iwan; J. Andreasson; N. Timneanu; M. Fajardo; J.S. Wark; David Riley; T. Tschentscher; J. Hajdu; R.W. Lee

doi:10.1364/OE.17.018271

Soft x-ray free electron laser microfocus for exploring matter under extreme conditions

A.J. Nelson, S. Toleikis, H. Chapman, S. Bajt, J. Krzywinski, J. Chalupsky, L. Juha, J. Cihelka, V. Hajkova, L. Vysin, T. Burian, M. Kozlova, R.R. Faustlin, B. Nagler, S.M. Vinko, T. Whitcher, T. Dzelzainis, O. Renner, K. Saksl, A.R. KhorsandP.A. Heimann, R. Sobierajski, D. Klinger, M. Jurek, J. Pelka, B. Iwan, J. Andreasson, N. Timneanu, M. Fajardo, J.S. Wark, David Riley, T. Tschentscher, J. Hajdu, R.W. Lee

Research output: Contribution to journal › Article › peer-review

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Abstract

We have focused a beam (BL3) of FLASH (Free-electron LASer in Hamburg: lambda = 13.5 nm, pulse length 15 fs, pulse energy 10-40 mu J, 5Hz) using a fine polished off-axis parabola having a focal length of 270 mm and coated with a Mo/Si multilayer with an initial reflectivity of 67% at 13.5 nm. The OAP was mounted and aligned with a picomotor controlled six-axis gimbal. Beam imprints on poly(methyl methacrylate) -PMMA were used to measure focus and the focused beam was used to create isochoric heating of various slab targets. Results show the focal spot has a diameter of

Original language	English
Pages (from-to)	18271-18278
Number of pages	8
Journal	Optics Express
Volume	17
Issue number	20
DOIs	https://doi.org/10.1364/OE.17.018271
Publication status	Published - 28 Sept 2009

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics

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10.1364/OE.17.018271

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Nelson, A. J., Toleikis, S., Chapman, H., Bajt, S., Krzywinski, J., Chalupsky, J., Juha, L., Cihelka, J., Hajkova, V., Vysin, L., Burian, T., Kozlova, M., Faustlin, R. R., Nagler, B., Vinko, S. M., Whitcher, T., Dzelzainis, T., Renner, O., Saksl, K., ... Lee, R. W. (2009). Soft x-ray free electron laser microfocus for exploring matter under extreme conditions. Optics Express, 17(20), 18271-18278. https://doi.org/10.1364/OE.17.018271

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title = "Soft x-ray free electron laser microfocus for exploring matter under extreme conditions",

abstract = "We have focused a beam (BL3) of FLASH (Free-electron LASer in Hamburg: lambda = 13.5 nm, pulse length 15 fs, pulse energy 10-40 mu J, 5Hz) using a fine polished off-axis parabola having a focal length of 270 mm and coated with a Mo/Si multilayer with an initial reflectivity of 67% at 13.5 nm. The OAP was mounted and aligned with a picomotor controlled six-axis gimbal. Beam imprints on poly(methyl methacrylate) -PMMA were used to measure focus and the focused beam was used to create isochoric heating of various slab targets. Results show the focal spot has a diameter of",

author = "A.J. Nelson and S. Toleikis and H. Chapman and S. Bajt and J. Krzywinski and J. Chalupsky and L. Juha and J. Cihelka and V. Hajkova and L. Vysin and T. Burian and M. Kozlova and R.R. Faustlin and B. Nagler and S.M. Vinko and T. Whitcher and T. Dzelzainis and O. Renner and K. Saksl and A.R. Khorsand and P.A. Heimann and R. Sobierajski and D. Klinger and M. Jurek and J. Pelka and B. Iwan and J. Andreasson and N. Timneanu and M. Fajardo and J.S. Wark and David Riley and T. Tschentscher and J. Hajdu and R.W. Lee",

year = "2009",

month = sep,

day = "28",

doi = "10.1364/OE.17.018271",

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Nelson, AJ, Toleikis, S, Chapman, H, Bajt, S, Krzywinski, J, Chalupsky, J, Juha, L, Cihelka, J, Hajkova, V, Vysin, L, Burian, T, Kozlova, M, Faustlin, RR, Nagler, B, Vinko, SM, Whitcher, T, Dzelzainis, T, Renner, O, Saksl, K, Khorsand, AR, Heimann, PA, Sobierajski, R, Klinger, D, Jurek, M, Pelka, J, Iwan, B, Andreasson, J, Timneanu, N, Fajardo, M, Wark, JS, Riley, D, Tschentscher, T, Hajdu, J & Lee, RW 2009, 'Soft x-ray free electron laser microfocus for exploring matter under extreme conditions', Optics Express, vol. 17, no. 20, pp. 18271-18278. https://doi.org/10.1364/OE.17.018271

TY - JOUR

T1 - Soft x-ray free electron laser microfocus for exploring matter under extreme conditions

AU - Nelson, A.J.

AU - Toleikis, S.

AU - Chapman, H.

AU - Bajt, S.

AU - Krzywinski, J.

AU - Chalupsky, J.

AU - Juha, L.

AU - Cihelka, J.

AU - Hajkova, V.

AU - Vysin, L.

AU - Burian, T.

AU - Kozlova, M.

AU - Faustlin, R.R.

AU - Nagler, B.

AU - Vinko, S.M.

AU - Whitcher, T.

AU - Dzelzainis, T.

AU - Renner, O.

AU - Saksl, K.

AU - Khorsand, A.R.

AU - Heimann, P.A.

AU - Sobierajski, R.

AU - Klinger, D.

AU - Jurek, M.

AU - Pelka, J.

AU - Iwan, B.

AU - Andreasson, J.

AU - Timneanu, N.

AU - Fajardo, M.

AU - Wark, J.S.

AU - Riley, David

AU - Tschentscher, T.

AU - Hajdu, J.

AU - Lee, R.W.

PY - 2009/9/28

Y1 - 2009/9/28

N2 - We have focused a beam (BL3) of FLASH (Free-electron LASer in Hamburg: lambda = 13.5 nm, pulse length 15 fs, pulse energy 10-40 mu J, 5Hz) using a fine polished off-axis parabola having a focal length of 270 mm and coated with a Mo/Si multilayer with an initial reflectivity of 67% at 13.5 nm. The OAP was mounted and aligned with a picomotor controlled six-axis gimbal. Beam imprints on poly(methyl methacrylate) -PMMA were used to measure focus and the focused beam was used to create isochoric heating of various slab targets. Results show the focal spot has a diameter of

AB - We have focused a beam (BL3) of FLASH (Free-electron LASer in Hamburg: lambda = 13.5 nm, pulse length 15 fs, pulse energy 10-40 mu J, 5Hz) using a fine polished off-axis parabola having a focal length of 270 mm and coated with a Mo/Si multilayer with an initial reflectivity of 67% at 13.5 nm. The OAP was mounted and aligned with a picomotor controlled six-axis gimbal. Beam imprints on poly(methyl methacrylate) -PMMA were used to measure focus and the focused beam was used to create isochoric heating of various slab targets. Results show the focal spot has a diameter of

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U2 - 10.1364/OE.17.018271

DO - 10.1364/OE.17.018271

M3 - Article

VL - 17

SP - 18271

EP - 18278

JO - Optics Express

JF - Optics Express

IS - 20

ER -

Soft x-ray free electron laser microfocus for exploring matter under extreme conditions

Abstract

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