Soft x-ray free electron laser microfocus for exploring matter under extreme conditions

A.J. Nelson, S. Toleikis, H. Chapman, S. Bajt, J. Krzywinski, J. Chalupsky, L. Juha, J. Cihelka, V. Hajkova, L. Vysin, T. Burian, M. Kozlova, R.R. Faustlin, B. Nagler, S.M. Vinko, T. Whitcher, T. Dzelzainis, O. Renner, K. Saksl, A.R. KhorsandP.A. Heimann, R. Sobierajski, D. Klinger, M. Jurek, J. Pelka, B. Iwan, J. Andreasson, N. Timneanu, M. Fajardo, J.S. Wark, David Riley, T. Tschentscher, J. Hajdu, R.W. Lee

Research output: Contribution to journalArticlepeer-review

42 Citations (Scopus)

Abstract

We have focused a beam (BL3) of FLASH (Free-electron LASer in Hamburg: lambda = 13.5 nm, pulse length 15 fs, pulse energy 10-40 mu J, 5Hz) using a fine polished off-axis parabola having a focal length of 270 mm and coated with a Mo/Si multilayer with an initial reflectivity of 67% at 13.5 nm. The OAP was mounted and aligned with a picomotor controlled six-axis gimbal. Beam imprints on poly(methyl methacrylate) -PMMA were used to measure focus and the focused beam was used to create isochoric heating of various slab targets. Results show the focal spot has a diameter of
Original languageEnglish
Pages (from-to)18271-18278
Number of pages8
JournalOptics Express
Volume17
Issue number20
DOIs
Publication statusPublished - 28 Sep 2009

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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