Abstract
Some recent advances in the application of microscopical and microanalytical techniques in materials science, especially the studies concerning rare metals were presented. It includes the highest resolution obtained with electron microscopy, observation of Moire patterns in transmission electron microscopy (TEM), electro-dimpling before ion beam thinning as an effective step in the preparation of TEM samples, hydrogen problem in atom probe analysis, and a novel analysis technique-laser microprobe mass spectrometry (LAMMS).
Original language | English |
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Pages (from-to) | 201-206 |
Number of pages | 6 |
Journal | Rare Metals |
Volume | 13 |
Issue number | 3 |
Publication status | Published - 01 Jul 1994 |
ASJC Scopus subject areas
- General Materials Science
- Metals and Alloys