Strain gradients in epitaxial ferroelectrics

G. Catalan, B. Noheda, J. McAneney, L.J. Sinnamon, Marty Gregg

Research output: Contribution to journalArticlepeer-review

215 Citations (Scopus)


X-ray analysis of ferroelectric thin layers of Ba1/2Sr1/2TiO3 with different thicknesses reveals the presence of strain gradients across the films and allows us to propose a functional form for the internal strain profile. We use this to calculate the influence of strain gradient, through flexoelectric coupling, on the degradation of the ferroelectric properties of films with decreasing thickness, in excellent agreement with the observed behavior. This paper shows that strain relaxation can lead to smooth, continuous gradients across hundreds of nanometers, and it highlights the pressing need to avoid such strain gradients in order to obtain ferroelectric films with bulklike properties.
Original languageEnglish
Article number020102
Pages (from-to)020102-020102
Number of pages1
JournalPhysical Review B (Condensed Matter)
Issue number2
Publication statusPublished - 01 Jul 2005

ASJC Scopus subject areas

  • Condensed Matter Physics


Dive into the research topics of 'Strain gradients in epitaxial ferroelectrics'. Together they form a unique fingerprint.

Cite this