Sub-nA spatially resolved conductivity profiling of surface and interface defects in ceria films

Tim Farrow, Nan Yang, Sandra Doria, Alex Belianinov, Stephen Jesse, Thomas M. Arruda, Giuseppe Balestrino, Sergei V. Kalinin, Amit Kumar

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)
298 Downloads (Pure)

Abstract

Spatial variability of conductivity in ceria is explored using scanning probe microscopy (SPM) with galvanostatic control. Ionically blocking electrodes are used to probe the conductivity under opposite polarities to reveal possible differences in the defect structure across a thin film of CeO2. Data suggests the existence of a large spatial inhomogeneity that could give rise to constant phase elements during standard electrochemical characterization, potentially affecting the overall conductivity of films on the macroscale. The approach discussed here can also be utilized for other mixed ionic electronic conductor (MIEC) systems including memristors and electroresistors, as well as physical systems such as ferroelectric tunneling barriers.
Original languageEnglish
Number of pages7
JournalAPL Materials
Volume3
Issue number3
Early online date17 Mar 2015
DOIs
Publication statusPublished - 2015

Keywords

  • Cerium Oxide
  • ATOMIC FORCE MICROSCOPY

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