Symbol Error Outage Performance Analysis of MCIK-OFDM over Complex TWDP Fading

Thien Van Luong, Youngwook Ko

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)
100 Downloads (Pure)

Abstract

This paper investigates the instantaneous symbol error outage probability (ISEOP) of a Multicarrier Index Keying with Orthogonal Frequency Division Multiplexing (MCIKOFDM) system using greedy detection, over Two-Way with Diffused Power (TWDP) fading channels. The closed-form expressions for the upper and lower bound on the ISEOP are derived to analyze the effects of TWDP and MCIK parameters on the outage performance of MCIK-OFDM. Through the numerical analysis and asymptotic case studies, we provide a new insight on the performance of MCIK-OFDM in a complex wireless propagation environment such as in Device-to-Device (D2D) communications that face a variety of fading conditions
Original languageEnglish
Title of host publicationEuropean Wireless 2017
PublisherEuropean Wireless Conference, EW
Publication statusPublished - 17 Aug 2017
EventEuropean Wireless 2017 - Dresden, Germany
Duration: 17 May 201719 May 2017
http://ew2017.european-wireless.org/

Conference

ConferenceEuropean Wireless 2017
CountryGermany
CityDresden
Period17/05/201719/05/2017
Internet address

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