Technology of SOI Monolithic Active Pixel Detectors for Improvement of I-V Characteristics and Reliability

Mervyn Armstrong, Michael Bain, Paul Baine, Harold Gamble, Fred Ruddell, Suli Suder, H. Niemiec, W. Kucewicz, M. Sapor, P. Grabiec, K. Kucharski, J. Marczewski, D. Tomaszewski

Research output: Contribution to conferencePaper

Original languageEnglish
Pages463-465
Number of pages3
Publication statusPublished - Feb 2008
EventProc 15th IEEE Intl Conf on Mixed Design of Integrated Circuits and Systems (MIXDES) - Poznan, Poland
Duration: 01 Feb 200801 Feb 2008

Conference

ConferenceProc 15th IEEE Intl Conf on Mixed Design of Integrated Circuits and Systems (MIXDES)
CountryPoland
CityPoznan
Period01/02/200801/02/2008

Cite this

Armstrong, M., Bain, M., Baine, P., Gamble, H., Ruddell, F., Suder, S., Niemiec, H., Kucewicz, W., Sapor, M., Grabiec, P., Kucharski, K., Marczewski, J., & Tomaszewski, D. (2008). Technology of SOI Monolithic Active Pixel Detectors for Improvement of I-V Characteristics and Reliability. 463-465. Paper presented at Proc 15th IEEE Intl Conf on Mixed Design of Integrated Circuits and Systems (MIXDES), Poznan, Poland.