Technology of SOI Monolithic Active Pixel Detectors for Improvement of I-V Characteristics and Reliability

Mervyn Armstrong; Michael Bain; Paul Baine; Harold Gamble; Fred Ruddell; Suli Suder; H. Niemiec; W. Kucewicz; M. Sapor; P. Grabiec; K. Kucharski; J. Marczewski; D. Tomaszewski

Technology of SOI Monolithic Active Pixel Detectors for Improvement of I-V Characteristics and Reliability

Mervyn Armstrong, Michael Bain, Paul Baine, Harold Gamble, Fred Ruddell, Suli Suder, H. Niemiec, W. Kucewicz, M. Sapor, P. Grabiec, K. Kucharski, J. Marczewski, D. Tomaszewski

Research output: Contribution to conference › Paper

Original language	English
Pages	463-465
Number of pages	3
Publication status	Published - Feb 2008
Event	Proc 15th IEEE Intl Conf on Mixed Design of Integrated Circuits and Systems (MIXDES) - Poznan, Poland Duration: 01 Feb 2008 → 01 Feb 2008

Conference

Conference	Proc 15th IEEE Intl Conf on Mixed Design of Integrated Circuits and Systems (MIXDES)
Country	Poland
City	Poznan
Period	01/02/2008 → 01/02/2008

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Cite this

Armstrong, M., Bain, M., Baine, P., Gamble, H., Ruddell, F., Suder, S., Niemiec, H., Kucewicz, W., Sapor, M., Grabiec, P., Kucharski, K., Marczewski, J., & Tomaszewski, D. (2008). Technology of SOI Monolithic Active Pixel Detectors for Improvement of I-V Characteristics and Reliability. 463-465. Paper presented at Proc 15th IEEE Intl Conf on Mixed Design of Integrated Circuits and Systems (MIXDES), Poznan, Poland.

Armstrong, Mervyn ; Bain, Michael ; Baine, Paul ; Gamble, Harold ; Ruddell, Fred ; Suder, Suli ; Niemiec, H. ; Kucewicz, W. ; Sapor, M. ; Grabiec, P. ; Kucharski, K. ; Marczewski, J. ; Tomaszewski, D. / Technology of SOI Monolithic Active Pixel Detectors for Improvement of I-V Characteristics and Reliability. Paper presented at Proc 15th IEEE Intl Conf on Mixed Design of Integrated Circuits and Systems (MIXDES), Poznan, Poland.3 p.

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title = "Technology of SOI Monolithic Active Pixel Detectors for Improvement of I-V Characteristics and Reliability",

author = "Mervyn Armstrong and Michael Bain and Paul Baine and Harold Gamble and Fred Ruddell and Suli Suder and H. Niemiec and W. Kucewicz and M. Sapor and P. Grabiec and K. Kucharski and J. Marczewski and D. Tomaszewski",

year = "2008",

month = feb,

language = "English",

pages = "463--465",

note = "Proc 15th IEEE Intl Conf on Mixed Design of Integrated Circuits and Systems (MIXDES) ; Conference date: 01-02-2008 Through 01-02-2008",

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Armstrong, M, Bain, M, Baine, P, Gamble, H, Ruddell, F, Suder, S, Niemiec, H, Kucewicz, W, Sapor, M, Grabiec, P, Kucharski, K, Marczewski, J & Tomaszewski, D 2008, 'Technology of SOI Monolithic Active Pixel Detectors for Improvement of I-V Characteristics and Reliability', Paper presented at Proc 15th IEEE Intl Conf on Mixed Design of Integrated Circuits and Systems (MIXDES), Poznan, Poland, 01/02/2008 - 01/02/2008 pp. 463-465.

Technology of SOI Monolithic Active Pixel Detectors for Improvement of I-V Characteristics and Reliability. / Armstrong, Mervyn; Bain, Michael; Baine, Paul; Gamble, Harold; Ruddell, Fred; Suder, Suli; Niemiec, H.; Kucewicz, W.; Sapor, M.; Grabiec, P.; Kucharski, K.; Marczewski, J.; Tomaszewski, D.

2008. 463-465 Paper presented at Proc 15th IEEE Intl Conf on Mixed Design of Integrated Circuits and Systems (MIXDES), Poznan, Poland.

Research output: Contribution to conference › Paper

TY - CONF

T1 - Technology of SOI Monolithic Active Pixel Detectors for Improvement of I-V Characteristics and Reliability

AU - Armstrong, Mervyn

AU - Bain, Michael

AU - Baine, Paul

AU - Gamble, Harold

AU - Ruddell, Fred

AU - Suder, Suli

AU - Niemiec, H.

AU - Kucewicz, W.

AU - Sapor, M.

AU - Grabiec, P.

AU - Kucharski, K.

AU - Marczewski, J.

AU - Tomaszewski, D.

PY - 2008/2

Y1 - 2008/2

UR - http://www.scopus.com/inward/record.url?scp=56349160628&partnerID=8YFLogxK

M3 - Paper

SP - 463

EP - 465

T2 - Proc 15th IEEE Intl Conf on Mixed Design of Integrated Circuits and Systems (MIXDES)

Y2 - 1 February 2008 through 1 February 2008

ER -