The effects of deposition conditions on micro-structure in polycrystalline silicon-germanium thin films: fractal characterisation using scanning probe microscopy

P.A. Campbell, D.G. Walmsley, D.L. Gay, R.L.F. Chong, Harold Gamble, David McNeill

Research output: Contribution to conferencePaper

Original languageEnglish
Pages0-0
Number of pages1
Publication statusPublished - Dec 1996
EventIOP Condensed Matter & Materials Physics Conference - York, United Kingdom
Duration: 01 Dec 199601 Dec 1996

Conference

ConferenceIOP Condensed Matter & Materials Physics Conference
CountryUnited Kingdom
CityYork
Period01/12/199601/12/1996

Cite this

Campbell, P. A., Walmsley, D. G., Gay, D. L., Chong, R. L. F., Gamble, H., & McNeill, D. (1996). The effects of deposition conditions on micro-structure in polycrystalline silicon-germanium thin films: fractal characterisation using scanning probe microscopy. 0-0. Paper presented at IOP Condensed Matter & Materials Physics Conference, York, United Kingdom.