TY - JOUR
T1 - Towards the determination of surface energy at the nanoscale
T2 - A further assessment of the afm-based approach
AU - Lamprou, Dimitrios A.
AU - Smith, James R.
AU - Nevell, Thomas G.
AU - Barbu, Eugen
AU - Willis, Colin R.
AU - Tsibouklis, John
PY - 2010/8/1
Y1 - 2010/8/1
N2 - Towards the validation of the atomic force microscopy-based approach to the determination of surface energy at the nanometer scale, this paper explores the applicability of the technique by comparing atomic force microscopy-derived surface energy values with those from conventional contact angle measurements from a range of self-assembled organosilane structures ((3-aminopropyl) triethoxysilane, (3-glycidoxypropyl)trimethoxysilane, 3-(triethoxysilyl) propylsuccinic anhydride and trimethoxy(propyl)silane) and also from films of an ultra-low-surface-energy polymer, poly(1H,1H,2H,2H-perfluorodecyl methacrylate). The close agreement between the two sets of data indicates the validity of the AFM method, while unique attributes are indicated by the high resolution (ca. 1000 atoms) that is inherent to the approach and by the capability to study materials that are not compatible with the probing liquids used for goniometric determinations.
AB - Towards the validation of the atomic force microscopy-based approach to the determination of surface energy at the nanometer scale, this paper explores the applicability of the technique by comparing atomic force microscopy-derived surface energy values with those from conventional contact angle measurements from a range of self-assembled organosilane structures ((3-aminopropyl) triethoxysilane, (3-glycidoxypropyl)trimethoxysilane, 3-(triethoxysilyl) propylsuccinic anhydride and trimethoxy(propyl)silane) and also from films of an ultra-low-surface-energy polymer, poly(1H,1H,2H,2H-perfluorodecyl methacrylate). The close agreement between the two sets of data indicates the validity of the AFM method, while unique attributes are indicated by the high resolution (ca. 1000 atoms) that is inherent to the approach and by the capability to study materials that are not compatible with the probing liquids used for goniometric determinations.
KW - Atomic Force Microscopy
KW - Goniometry
KW - Organosilanes
KW - Surface Energy
UR - http://www.scopus.com/inward/record.url?scp=84867399162&partnerID=8YFLogxK
UR - https://researchportal.port.ac.uk/portal/en/theses/towards-the-determination-of-surface-energy-at-the-nanoscale(8a0a17be-dab5-4e5d-8026-ecf57e88e7e7).html
U2 - 10.1166/jamr.2010.1035
DO - 10.1166/jamr.2010.1035
M3 - Article
AN - SCOPUS:84867399162
VL - 5
SP - 137
EP - 142
JO - Journal of Advanced Microscopy Research
JF - Journal of Advanced Microscopy Research
SN - 2156-7573
IS - 2
ER -