Transient inversion XUV-lasers in Ti and Ge

P.V. Nickles, M. Schnurer, M.P. Kalachnikov, W. Sandner, V.N. Shlyaptsev, C. Danson, D. Neely, E. Wolfrum, J. Zhang, A. Behjat, A. Demir, G. Tallents, P.J. Warwick, Ciaran Lewis

Research output: Contribution to conferencePaper

4 Citations (Scopus)
Original languageEnglish
Pages80-85
Number of pages6
Publication statusPublished - Jul 1997
EventConference on Soft X-Ray Lasers and Applications II - San Diego, Ca, United States
Duration: 01 Jul 199701 Jul 1997

Conference

ConferenceConference on Soft X-Ray Lasers and Applications II
CountryUnited States
CitySan Diego, Ca
Period01/07/199701/07/1997

Cite this

Nickles, P. V., Schnurer, M., Kalachnikov, M. P., Sandner, W., Shlyaptsev, V. N., Danson, C., Neely, D., Wolfrum, E., Zhang, J., Behjat, A., Demir, A., Tallents, G., Warwick, P. J., & Lewis, C. (1997). Transient inversion XUV-lasers in Ti and Ge. 80-85. Paper presented at Conference on Soft X-Ray Lasers and Applications II, San Diego, Ca, United States.