Unconventional Antiferroelectric Phase Stabilization in Thin Film BiFeO3 by Interface-Induced Rotoelectric Coupling Effect

Y. M. Kim; A. Hatt; A. Kumar; I. Ivanov; A. Morozovska; A. Tselev; Y. H. Chu; P. Yu; M. D. Biegalski; R. Ramesh; E. Eliseev; S. J. Pennycook; J. Rondinelli; S. V. Kalinin; A. Y. Borisevich

doi:10.1017/S1431927612003911

Unconventional Antiferroelectric Phase Stabilization in Thin Film BiFeO3 by Interface-Induced Rotoelectric Coupling Effect

Y. M. Kim
, A. Hatt
, A. Kumar
, I. Ivanov
, A. Morozovska
, A. Tselev
, Y. H. Chu
, P. Yu
, M. D. Biegalski
, R. Ramesh
, E. Eliseev
, S. J. Pennycook
, J. Rondinelli
, S. V. Kalinin
, A. Y. Borisevich

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	412-413
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	18
DOIs	https://doi.org/10.1017/S1431927612003911
Publication status	Published - 01 Jan 2012
Externally published	Yes

ASJC Scopus subject areas

Instrumentation

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Kim, Y. M., Hatt, A., Kumar, A., Ivanov, I., Morozovska, A., Tselev, A., Chu, Y. H., Yu, P., Biegalski, M. D., Ramesh, R., Eliseev, E., Pennycook, S. J., Rondinelli, J., Kalinin, S. V., & Borisevich, A. Y. (2012). Unconventional Antiferroelectric Phase Stabilization in Thin Film BiFeO3 by Interface-Induced Rotoelectric Coupling Effect. Microscopy and Microanalysis, 18, 412-413. https://doi.org/10.1017/S1431927612003911

@article{476e154f12c74e71960685f902b32a2e,

title = "Unconventional Antiferroelectric Phase Stabilization in Thin Film BiFeO3 by Interface-Induced Rotoelectric Coupling Effect",

author = "Kim, \{Y. M.\} and A. Hatt and A. Kumar and I. Ivanov and A. Morozovska and A. Tselev and Chu, \{Y. H.\} and P. Yu and Biegalski, \{M. D.\} and R. Ramesh and E. Eliseev and Pennycook, \{S. J.\} and J. Rondinelli and Kalinin, \{S. V.\} and Borisevich, \{A. Y.\}",

year = "2012",

month = jan,

day = "1",

doi = "10.1017/S1431927612003911",

language = "English",

volume = "18",

pages = "412--413",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

}

Kim, YM, Hatt, A, Kumar, A, Ivanov, I, Morozovska, A, Tselev, A, Chu, YH, Yu, P, Biegalski, MD, Ramesh, R, Eliseev, E, Pennycook, SJ, Rondinelli, J, Kalinin, SV & Borisevich, AY 2012, 'Unconventional Antiferroelectric Phase Stabilization in Thin Film BiFeO3 by Interface-Induced Rotoelectric Coupling Effect', Microscopy and Microanalysis, vol. 18, pp. 412-413. https://doi.org/10.1017/S1431927612003911

TY - JOUR

T1 - Unconventional Antiferroelectric Phase Stabilization in Thin Film BiFeO3 by Interface-Induced Rotoelectric Coupling Effect

AU - Kim, Y. M.

AU - Hatt, A.

AU - Kumar, A.

AU - Ivanov, I.

AU - Morozovska, A.

AU - Tselev, A.

AU - Chu, Y. H.

AU - Yu, P.

AU - Biegalski, M. D.

AU - Ramesh, R.

AU - Eliseev, E.

AU - Pennycook, S. J.

AU - Rondinelli, J.

AU - Kalinin, S. V.

AU - Borisevich, A. Y.

PY - 2012/1/1

Y1 - 2012/1/1

UR - https://www.scopus.com/pages/publications/85007947186

U2 - 10.1017/S1431927612003911

DO - 10.1017/S1431927612003911

M3 - Article

AN - SCOPUS:85007947186

SN - 1431-9276

VL - 18

SP - 412

EP - 413

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

ER -

Unconventional Antiferroelectric Phase Stabilization in Thin Film BiFeO3 by Interface-Induced Rotoelectric Coupling Effect

ASJC Scopus subject areas

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