VIEWING LEED PATTERNS AS ELECTRON HOLOGRAMS

P HU*, DA KING

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

It is shown theoretically that LEED patterns from ordered overlayer systems bear a strong relationship to electron holograms, and that phase information is recorded in the diffraction intensities. It is, therefore, possible to obtain structural information by direct holographic inversion from conventional LEED I-V spectra.

Original languageEnglish
Pages (from-to)396-401
Number of pages6
JournalApplied Surface Science
Volume70-1
Publication statusPublished - 1993

Keywords

  • MULTIPLE-SCATTERING
  • ATOMIC-RESOLUTION
  • TENSOR LEED
  • PHOTOEMISSION
  • DIFFRACTION
  • SURFACE
  • IMAGES

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