Abstract
It is shown theoretically that LEED patterns from ordered overlayer systems bear a strong relationship to electron holograms, and that phase information is recorded in the diffraction intensities. It is, therefore, possible to obtain structural information by direct holographic inversion from conventional LEED I-V spectra.
| Original language | English |
|---|---|
| Pages (from-to) | 396-401 |
| Number of pages | 6 |
| Journal | Applied Surface Science |
| Volume | 70-1 |
| Publication status | Published - 1993 |
Keywords
- MULTIPLE-SCATTERING
- ATOMIC-RESOLUTION
- TENSOR LEED
- PHOTOEMISSION
- DIFFRACTION
- SURFACE
- IMAGES