X-ray laser-induced ablation of lead compounds

V. Hajkova; L. Juha; P. Bohacek; T. Burian; J. Chalupsky; L. Vysin; J. Gaudin; P. A. Heimann; S. P. Hau-Riege; M. Jurek; D. Klinger; J. Pelka; R. Sobierajski; J. Krzywinski; M. Messerschmidt; S. P. Moeller; B. Nagler; M. Rowen; W. F. Schlotter; M. L. Swiggers; J. J. Turner; S. M. Vinko; T. Whitcher; J. Wark; M. Matuchova; S. Bajt; H. Chapman; T. Dzelzainis; D. Riley; J. Andreasson; J. Hajdu; B. Iwan; N. Timneanu; K. Saksl; R. Faeustlin; A. Singer; K. Tiedtke; S. Toleikis; I. Vartaniants; H. Wabnitz

doi:10.1117/12.890134

X-ray laser-induced ablation of lead compounds

V. Hajkova^*, L. Juha, P. Bohacek, T. Burian, J. Chalupsky, L. Vysin, J. Gaudin, P. A. Heimann, S. P. Hau-Riege, M. Jurek, D. Klinger, J. Pelka, R. Sobierajski, J. Krzywinski, M. Messerschmidt, S. P. Moeller, B. Nagler, M. Rowen, W. F. Schlotter, M. L. SwiggersJ. J. Turner, S. M. Vinko, T. Whitcher, J. Wark, M. Matuchova, S. Bajt, H. Chapman, T. Dzelzainis, D. Riley, J. Andreasson, J. Hajdu, B. Iwan, N. Timneanu, K. Saksl, R. Faeustlin, A. Singer, K. Tiedtke, S. Toleikis, I. Vartaniants, H. Wabnitz

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

10 Citations (Scopus)

Abstract

The recent commissioning of a X-ray free-electron laser triggered an extensive research in the area of X-ray ablation of high-Z, high-density materials. Such compounds should be used to shorten an effective attenuation length for obtaining clean ablation imprints required for the focused beam analysis. Compounds of lead (Z=82) represent the materials of first choice. In this contribution, single-shot ablation thresholds are reported for PbWO4 and PbI2 exposed to ultra-short pulses of extreme ultraviolet radiation and X-rays at FLASH and LCLS facilities, respectively. Interestingly, the threshold reaches only 0.11 J/cm(2) at 1.55 nm in lead tungstate although a value of 0.4 J/cm(2) is expected according to the wavelength dependence of an attenuation length and the threshold value determined in the XUV spectral region, i.e., 79 mJ/cm(2) at a FEL wavelength of 13.5 nm. Mechanisms of ablation processes are discussed to explain this discrepancy. Lead iodide shows at 1.55 nm significantly lower ablation threshold than tungstate although an attenuation length of the radiation is in both materials quite the same. Lower thermal and radiation stability of PbI2 is responsible for this finding.

Original language	English
Title of host publication	DAMAGE TO VUV, EUV, AND X-RAY OPTICS III
Editors	L Juha, S Bajt, RA London
Place of Publication	BELLINGHAM
Publisher	SPIE - The International Society for Optical Engineering
Number of pages	7
DOIs	https://doi.org/10.1117/12.890134
Publication status	Published - 2011
Event	Conference on Damage to VUV, EUV, and X-ray Optics III - Prague, Czech Republic Duration: 18 Apr 2011 → 20 Apr 2011

Publication series

Name	Proceedings of SPIE
Publisher	SPIE-INT SOC OPTICAL ENGINEERING
Volume	8077
ISSN (Print)	0277-786X

Conference

Conference	Conference on Damage to VUV, EUV, and X-ray Optics III
Country/Territory	Czech Republic
Period	18/04/2011 → 20/04/2011

Keywords

extreme ultraviolet laser
x-ray laser
free-electron laser
radiation damage
laser ablation
damage thresholds
single-shot damage
focused beam characterization
FREE-ELECTRON LASER
DECOMPOSITION
CRYSTALS
IODIDE
LINAC

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10.1117/12.890134

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Hajkova, V., Juha, L., Bohacek, P., Burian, T., Chalupsky, J., Vysin, L., Gaudin, J., Heimann, P. A., Hau-Riege, S. P., Jurek, M., Klinger, D., Pelka, J., Sobierajski, R., Krzywinski, J., Messerschmidt, M., Moeller, S. P., Nagler, B., Rowen, M., Schlotter, W. F., ... Wabnitz, H. (2011). X-ray laser-induced ablation of lead compounds. In L. Juha, S. Bajt, & RA. London (Eds.), DAMAGE TO VUV, EUV, AND X-RAY OPTICS III (Proceedings of SPIE; Vol. 8077). SPIE - The International Society for Optical Engineering. https://doi.org/10.1117/12.890134

@inproceedings{af44c68ca66e46a489908d037f8046b9,

title = "X-ray laser-induced ablation of lead compounds",

abstract = "The recent commissioning of a X-ray free-electron laser triggered an extensive research in the area of X-ray ablation of high-Z, high-density materials. Such compounds should be used to shorten an effective attenuation length for obtaining clean ablation imprints required for the focused beam analysis. Compounds of lead (Z=82) represent the materials of first choice. In this contribution, single-shot ablation thresholds are reported for PbWO4 and PbI2 exposed to ultra-short pulses of extreme ultraviolet radiation and X-rays at FLASH and LCLS facilities, respectively. Interestingly, the threshold reaches only 0.11 J/cm(2) at 1.55 nm in lead tungstate although a value of 0.4 J/cm(2) is expected according to the wavelength dependence of an attenuation length and the threshold value determined in the XUV spectral region, i.e., 79 mJ/cm(2) at a FEL wavelength of 13.5 nm. Mechanisms of ablation processes are discussed to explain this discrepancy. Lead iodide shows at 1.55 nm significantly lower ablation threshold than tungstate although an attenuation length of the radiation is in both materials quite the same. Lower thermal and radiation stability of PbI2 is responsible for this finding.",

keywords = "extreme ultraviolet laser, x-ray laser, free-electron laser, radiation damage, laser ablation, damage thresholds, single-shot damage, focused beam characterization, FREE-ELECTRON LASER, DECOMPOSITION, CRYSTALS, IODIDE, LINAC",

author = "V. Hajkova and L. Juha and P. Bohacek and T. Burian and J. Chalupsky and L. Vysin and J. Gaudin and Heimann, {P. A.} and Hau-Riege, {S. P.} and M. Jurek and D. Klinger and J. Pelka and R. Sobierajski and J. Krzywinski and M. Messerschmidt and Moeller, {S. P.} and B. Nagler and M. Rowen and Schlotter, {W. F.} and Swiggers, {M. L.} and Turner, {J. J.} and Vinko, {S. M.} and T. Whitcher and J. Wark and M. Matuchova and S. Bajt and H. Chapman and T. Dzelzainis and D. Riley and J. Andreasson and J. Hajdu and B. Iwan and N. Timneanu and K. Saksl and R. Faeustlin and A. Singer and K. Tiedtke and S. Toleikis and I. Vartaniants and H. Wabnitz",

year = "2011",

doi = "10.1117/12.890134",

language = "English",

series = "Proceedings of SPIE",

publisher = "SPIE - The International Society for Optical Engineering",

editor = "L Juha and S Bajt and RA London",

booktitle = "DAMAGE TO VUV, EUV, AND X-RAY OPTICS III",

address = "United States",

note = "Conference on Damage to VUV, EUV, and X-ray Optics III ; Conference date: 18-04-2011 Through 20-04-2011",

}

Hajkova, V, Juha, L, Bohacek, P, Burian, T, Chalupsky, J, Vysin, L, Gaudin, J, Heimann, PA, Hau-Riege, SP, Jurek, M, Klinger, D, Pelka, J, Sobierajski, R, Krzywinski, J, Messerschmidt, M, Moeller, SP, Nagler, B, Rowen, M, Schlotter, WF, Swiggers, ML, Turner, JJ, Vinko, SM, Whitcher, T, Wark, J, Matuchova, M, Bajt, S, Chapman, H, Dzelzainis, T, Riley, D, Andreasson, J, Hajdu, J, Iwan, B, Timneanu, N, Saksl, K, Faeustlin, R, Singer, A, Tiedtke, K, Toleikis, S, Vartaniants, I & Wabnitz, H 2011, X-ray laser-induced ablation of lead compounds. in L Juha, S Bajt & RA London (eds), DAMAGE TO VUV, EUV, AND X-RAY OPTICS III. Proceedings of SPIE, vol. 8077, SPIE - The International Society for Optical Engineering, BELLINGHAM, Conference on Damage to VUV, EUV, and X-ray Optics III, Czech Republic, 18/04/2011. https://doi.org/10.1117/12.890134

TY - GEN

T1 - X-ray laser-induced ablation of lead compounds

AU - Hajkova, V.

AU - Juha, L.

AU - Bohacek, P.

AU - Burian, T.

AU - Chalupsky, J.

AU - Vysin, L.

AU - Gaudin, J.

AU - Heimann, P. A.

AU - Hau-Riege, S. P.

AU - Jurek, M.

AU - Klinger, D.

AU - Pelka, J.

AU - Sobierajski, R.

AU - Krzywinski, J.

AU - Messerschmidt, M.

AU - Moeller, S. P.

AU - Nagler, B.

AU - Rowen, M.

AU - Schlotter, W. F.

AU - Swiggers, M. L.

AU - Turner, J. J.

AU - Vinko, S. M.

AU - Whitcher, T.

AU - Wark, J.

AU - Matuchova, M.

AU - Bajt, S.

AU - Chapman, H.

AU - Dzelzainis, T.

AU - Riley, D.

AU - Andreasson, J.

AU - Hajdu, J.

AU - Iwan, B.

AU - Timneanu, N.

AU - Saksl, K.

AU - Faeustlin, R.

AU - Singer, A.

AU - Tiedtke, K.

AU - Toleikis, S.

AU - Vartaniants, I.

AU - Wabnitz, H.

PY - 2011

Y1 - 2011

N2 - The recent commissioning of a X-ray free-electron laser triggered an extensive research in the area of X-ray ablation of high-Z, high-density materials. Such compounds should be used to shorten an effective attenuation length for obtaining clean ablation imprints required for the focused beam analysis. Compounds of lead (Z=82) represent the materials of first choice. In this contribution, single-shot ablation thresholds are reported for PbWO4 and PbI2 exposed to ultra-short pulses of extreme ultraviolet radiation and X-rays at FLASH and LCLS facilities, respectively. Interestingly, the threshold reaches only 0.11 J/cm(2) at 1.55 nm in lead tungstate although a value of 0.4 J/cm(2) is expected according to the wavelength dependence of an attenuation length and the threshold value determined in the XUV spectral region, i.e., 79 mJ/cm(2) at a FEL wavelength of 13.5 nm. Mechanisms of ablation processes are discussed to explain this discrepancy. Lead iodide shows at 1.55 nm significantly lower ablation threshold than tungstate although an attenuation length of the radiation is in both materials quite the same. Lower thermal and radiation stability of PbI2 is responsible for this finding.

AB - The recent commissioning of a X-ray free-electron laser triggered an extensive research in the area of X-ray ablation of high-Z, high-density materials. Such compounds should be used to shorten an effective attenuation length for obtaining clean ablation imprints required for the focused beam analysis. Compounds of lead (Z=82) represent the materials of first choice. In this contribution, single-shot ablation thresholds are reported for PbWO4 and PbI2 exposed to ultra-short pulses of extreme ultraviolet radiation and X-rays at FLASH and LCLS facilities, respectively. Interestingly, the threshold reaches only 0.11 J/cm(2) at 1.55 nm in lead tungstate although a value of 0.4 J/cm(2) is expected according to the wavelength dependence of an attenuation length and the threshold value determined in the XUV spectral region, i.e., 79 mJ/cm(2) at a FEL wavelength of 13.5 nm. Mechanisms of ablation processes are discussed to explain this discrepancy. Lead iodide shows at 1.55 nm significantly lower ablation threshold than tungstate although an attenuation length of the radiation is in both materials quite the same. Lower thermal and radiation stability of PbI2 is responsible for this finding.

KW - extreme ultraviolet laser

KW - x-ray laser

KW - free-electron laser

KW - radiation damage

KW - laser ablation

KW - damage thresholds

KW - single-shot damage

KW - focused beam characterization

KW - FREE-ELECTRON LASER

KW - DECOMPOSITION

KW - CRYSTALS

KW - IODIDE

KW - LINAC

U2 - 10.1117/12.890134

DO - 10.1117/12.890134

M3 - Conference contribution

T3 - Proceedings of SPIE

BT - DAMAGE TO VUV, EUV, AND X-RAY OPTICS III

A2 - Juha, L

A2 - Bajt, S

A2 - London, RA

PB - SPIE - The International Society for Optical Engineering

CY - BELLINGHAM

T2 - Conference on Damage to VUV, EUV, and X-ray Optics III

Y2 - 18 April 2011 through 20 April 2011

ER -

X-ray laser-induced ablation of lead compounds

Abstract

Publication series

Conference

Keywords

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