XOR gate based low-cost configurable RO PUF

Lei Zhang, Chenghua Wang, Weiqiang Liu, Maire O'Neill, Fabrizio Lombardi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

13 Citations (Scopus)

Abstract

A Physical Unclonable Function (PUF) is often used to uniquely identify an integrated circuit by extracting its internal random differences using so-called Challenge Response Pairs (CRPs). As CRPs include unique information about the underlying hardware variations, PUF design is a promising approach to provide authentication and IP-protection capabilities. In this paper, an XOR-gate-based configurable Ring Oscillator (RO) PUF (denoted as XCRO PUF) is presented. This XCRO PUF can generate more CRPs compared with state-of-the-art PUF designs by using the same number of configurable logic blocks (CLBs) in an FPGA implementation. This design is implemented in the Xilinx Spartan-6 XC6SLX9 FPGAS with fixed locations for the XCROs (placed within a ring to improve its uniqueness). The XCRO PUF shows better uniqueness and reliability than other PUF designs. Moreover, a XCRO PUF consumes only 12.5% of the hardware resources to generate a 1-bit response compared with other CRO PUFs implemented in FPGA.

Original languageEnglish
Title of host publication2017 IEEE International Symposium on Circuits and Systems (ISCAS): Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781467368520
DOIs
Publication statusPublished - 28 Sep 2017
Event50th IEEE International Symposium on Circuits and Systems, ISCAS 2017 - Baltimore, United States
Duration: 28 May 201731 May 2017

Publication series

NameIEEE International Symposium on Circuits and Systems (ISCAS): Proceedings
PublisherIEEE
ISSN (Electronic)2379-447X

Conference

Conference50th IEEE International Symposium on Circuits and Systems, ISCAS 2017
CountryUnited States
CityBaltimore
Period28/05/201731/05/2017

Keywords

  • FPGA
  • physical unclonable function
  • reliability
  • uniqueness

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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