Yield in inhomogeneous PtSi-n-Si Schottky photodetectors

A. Sellai, Paul Dawson

Research output: Contribution to conferencePaper

7 Citations (Scopus)
Original languageEnglish
Pages372-375
Number of pages4
DOIs
Publication statusPublished - Jun 2006
Event4th International Conference on New Developments in Photodetection - Beaune, France
Duration: 01 Jun 200601 Jun 2006

Conference

Conference4th International Conference on New Developments in Photodetection
CountryFrance
CityBeaune
Period01/06/200601/06/2006

Cite this

Sellai, A., & Dawson, P. (2006). Yield in inhomogeneous PtSi-n-Si Schottky photodetectors. 372-375. Paper presented at 4th International Conference on New Developments in Photodetection, Beaune, France. https://doi.org/10.1016/j.nima.2006.05.147