David McNeill

    David McNeill

    Senior Lecturer

    Phone: +44 (0)28 9097 4534

    For media contact email comms.office@qub.ac.uk
    or call +44(0)2890 973091.

    Scopus Citations 0

    1. Published

      Investigation of copper layers deposited by CVD using Cu(I)hfac(TMVS) precursor

      Toh, B. H. W., McNeill, D. & Gamble, H., Jul 2005, In : Journal of Materials Science: Materials in Electronics. 16(7), 7, p. 437-443 7 p.

      Research output: Contribution to journalArticle

    2. Published

      Investigation of crystalline quality and stress in germanium stripes fabricated by rapid melt growth process

      Perova, T. S., Zainal, N., Adley, D., Mitchell, N., McNeill, D., Bain, M., Armstrong, M. & Baine, P., Jul 2012.

      Research output: Contribution to conferencePaper

    3. Published

      Investigation of crystalline quality and stress in Germanium-On-Insulator layers

      Litvin, A., Adley, D., Perova, T. S., Zainal, N., Mitchell, N., McNeill, D., Bain, M., Armstrong, M. & Baine, P., Aug 2011, p. 62-62. 1 p.

      Research output: Contribution to conferencePaper

    4. Published

      Investigation of germanium implanted with hydrogen for layer transfer applications

      Perova, T. S., Armstrong, M., Wasyluk, J., Baine, P., Rainey, P., Mitchell, N., McNeill, D., Gamble, H. & Hurley, R., Aug 2011, In : Solid State Phenomena. 178-179, p. 295-300 6 p.

      Research output: Contribution to journalArticle

    5. Published

      Investigation of p-type contamination in thin SOI layers during fabrication

      Uppal, S., Gay, D. L., Armstrong, A., McNeill, D., Baine, P., Armstrong, M., Gamble, H. & Yallop, K., Apr 1999, p. 0-0. 1 p.

      Research output: Contribution to conferencePaper

    6. Published

      Investigation of stress and structural damage in H and He implanted Ge using micro-Raman mapping technique on bevelled samples

      Wasyluk, J., Rainey, P. V., Perova, T. S., Mitchell, N., McNeill, D., Gamble, H., Armstrong, M. & Hurley, R., Mar 2012, In : Journal of Raman Spectroscopy. 43, 3, p. 448-454 7 p.

      Research output: Contribution to journalArticle

    7. Published

      Long-Range Lateral Dopant Diffusion in Tungsten Silicide Layers

      Liao, S., Bain, M., Baine, P., McNeill, D., Armstrong, M. & Gamble, H., Feb 2009, In : IEEE Transactions on Semiconductor Manufacturing. 22, 1, p. 80-87 8 p., 4773502., 4773502

      Research output: Contribution to journalArticle

    8. Published

      Long-term stability of mechanically exfoliated MoS2 flakes

      Budania, P., McNeill, D., Mitchell, N., Modreanu, M. & Hurley, P., 2017.

      Research output: Contribution to conferencePaper

    9. Published

      Low Temperature Bonding of PECVD Silicon Dioxide Layers

      Baine, P., Bain, M., McNeill, D., Gamble, H. & Armstrong, M., Nov 2006, In : ECS Transactions. 3(6), 6, p. 165-173 9 p.

      Research output: Contribution to journalArticle

    10. Published

      Low temperature epitaxial silicon growth in a rapid thermal processor

      McNeill, D., Gamble, H. & Armstrong, M., May 1991, p. 235-240. 6 p.

      Research output: Contribution to conferencePaper

    11. Published

      Low temperature epitaxy of Si/Si1-xGex/Si multi-layers by low pressure RTCVD for very thin SOI applications

      McNeill, D., Gay, D. L., Li, X., Armstrong, M. & Gamble, H., Apr 1998, p. 307-313. 7 p.

      Research output: Contribution to conferencePaper

    12. Published

      Low temperature measurement of TFTs fabricated on germanium-on-sapphire substrates

      Baine, P., Gamble, H., Armstrong, M., Mitchell, N., McNeill, D., Rainey, P., Low, Y., Low, Y. W. & Tantraviwat, D., Sep 2009, p. 0-0. 1 p.

      Research output: Contribution to conferencePaper

    13. Published

      Low temperature processes for manufacture of germanium MOS transistors

      Baine, P., Gamble, H., Armstrong, M., Mitchell, N., McNeill, D., Rainey, P., Low, Y., Low, Y. W. & Tantraviwat, D., Jan 2009, p. 143-144. 2 p.

      Research output: Contribution to conferencePaper

    14. Published

      Low temperature surface nitridation processes for dielectric-Ge interfaces

      Wadsworth, H. J., Bhattacharya, S., Ruddell, F. H., McNeill, D. W., Mitchell, N., Armstrong, B. M., Gamble, H. S. & Denvir, D., 01 Jan 2006, In : ECS Transactions. 3, 7, p. 531-537 7 p.

      Research output: Contribution to journalArticle

    15. Published

      Manufacture processes for GPSOI substrates and their influence on cross-talk suppression

      Baine, P., Gamble, H., Armstrong, M., McNeill, D., Bain, M., Hamel, J. S. & Kraft, M., Apr 2003, p. 57-63. 7 p.

      Research output: Contribution to conferencePaper

    16. Published

      Manufacturing processes for WSi2-GPSOI substrates and their influence on cross-talk suppression and inductance

      Armstrong, M., Bain, M., Baine, P., Gamble, H. & McNeill, D., Sep 2003. 7 p.

      Research output: Contribution to conferencePaper

    17. Published

      Manufacturing processes for WSi2-GPSOI substrates and their influence on cross-talk suppression and inductance

      Baine, P., Gamble, H., Armstrong, M., Bain, M., McNeill, D., Hamel, J., Stefanos, S. & Kraft, M., Apr 2003.

      Research output: Contribution to conferencePaper

    18. Published

      Medium Doped Non-Suspended Silicon Nanowire Piezoresistor using SIMOX substrate

      Tan, T. H., Mitchell, S. J. N., McNeill, D. W., Wadsworth, H., Strahan, S. & Bailie, I., 30 Mar 2017, International Conference on Advances in Electrical, Electronic and Systems Engineering (ICAEES): Proceedings. IEEE , p. 189-193 5 p.

      Research output: Chapter in Book/Report/Conference proceedingConference contribution

    19. Published

      Micro-Raman and Spreading Resistance Analysis on Beveled Implanted Germanium for Layer Transfer Applications

      Rainey, P., Wasyluk, J., Perova, T., Hurley, R., Mitchell, N., McNeill, D., Gamble, H. & Armstrong, M., Feb 2011, In : Electrochemical and Solid-State Letters. 14(2), 2, p. H69-H72 4 p.

      Research output: Contribution to journalArticle

    20. Published
    21. Published

      Optimisation and scaling of interfacial GeO2 layers for high-k gate stacks on germanium and extraction of dielectric constant of GeO2

      Murad, S., McNeill, D., Mitchell, N., Armstrong, M., Modreanu, M., Hughes, G. & Chellappan, R. K., Dec 2011. 2 p.

      Research output: Contribution to conferencePaper

    22. Published

      Optimisation and scaling of interfacial GeO2 layers for high-k gate stacks on germanium and extraction of dielectric constant of GeO2

      Murad, S. N. A., Baine, P. T., McNeill, D. W., Mitchell, N., Armstrong, B. M., Modreanu, M., Hughes, G. & Chellappan, R. K., Dec 2012, In : SOLID-STATE ELECTRONICS. 78, p. 136-140 5 p.

      Research output: Contribution to journalArticle

    23. Published

      Optimisation of tungsten disilicide dopant diffusion conduits for SSOI applications

      Liao, S., Bain, M., Baine, P., McNeill, D., Armstrong, M. & Gamble, H., Jan 2009, p. 83-84. 2 p.

      Research output: Contribution to conferencePaper

    24. Published

      Post-exfoliation annealing and ultrasonic treatment on mechanically exfoliated MoS2

      Budania, P., Mitchell, N. & McNeill, D., Jun 2016.

      Research output: Contribution to conferencePaper

    25. Published

      Raman mapping analysis of structural damage in ion implanted bevelled Ge samples with application in smart cut technology

      Wasyluk, J., Rainey, P., Perova, T. S., Hurley, R., Mitchell, N., McNeill, D., Gamble, H. & Armstrong, M., Aug 2010, p. 0-0. 1 p.

      Research output: Contribution to conferencePaper