Investigation of stress and structural damage in H and He implanted Ge using micro-Raman mapping technique on bevelled samples

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    DOI

    Original languageEnglish
    Number of pages7
    Pages (from-to)448-454
    JournalJournal of Raman Spectroscopy
    Journal publication dateMar 2012
    Issue number3
    Volume43
    DOIs
    Publication statusPublished - Mar 2012

    ID: 1025923