The effects of deposition conditions on micro-structure in polycrystalline silicon-germanium thin films: fractal characterisation using scanning probe microscopy

    Research output: Contribution to conferencePaper

    Published
    • P.A. Campbell
    • D.G. Walmsley
    • D.L. Gay
    • R.L.F. Chong
    • Harold Gamble
    • David McNeill

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    Original languageEnglish
    Pages0-0
    Number of pages1
    Publication statusPublished - Dec 1996
    EventIOP Condensed Matter & Materials Physics Conference - York, United Kingdom
    Duration: 01 Dec 199601 Dec 1996

    Conference

    ConferenceIOP Condensed Matter & Materials Physics Conference
    CountryUnited Kingdom
    CityYork
    Period01/12/199601/12/1996

    ID: 734154